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General Electric

GE VMIVME-2510B-100 64-Bit TTL I/O Megamodule VMIVME2510B

Manufacturer:GE

Product Number: VMIVME-2510B-100

Product Type: TTL I/O Megamodule

Place of Origin: USA

Price Range: $3000

✓ Payment Method: Telegraphic Transfer (T/T)

✓ Warranty Period: 12 months

✓ In Stock


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The GE VMIVME-2510B-100 is a VMEbus-compatible 64-bit TTL input/output module, belonging to VMIC’s Megamodule product series. Featuring flexible programmability, high reliability and comprehensive self-test functions, it supports multi-bit data transmission and is tailored for industrial control scenarios, delivering an efficient and stable I/O interface solution for systems.

related documents

VMIVME-2510B Manual.pdf

GE VMIVME-2510B-100 64-Bit TTL IO Megamodule VMIVME2510B..jpg

Core Features

Flexible I/O Control: The direction of each 8-bit port can be independently programmed. The 64-bit I/O can be addressed as two 32-bit longwords, four 16-bit words, or eight 8-bit bytes, meeting diverse data transmission requirements.

Powerful Driving Capability: It provides a sink current capacity of 64mA (and a source current capacity of 15mA), with optional open-collector outputs and pull-up resistors, suitable for connection scenarios with a variety of external devices.

Efficient Address Mapping: Equipped with two sets of board address selection switches corresponding to the Control and Status Register (CSR) and I/O data registers respectively. It can map addresses to continuous memory spaces, facilitating multi-board cascade configuration.

Comprehensive Self-test Function: Built-in test logic supports offline and online fault detection and isolation. The Fail LED on the front panel indicates fault status in real time, and diagnostics are automatically initiated after system power-on or reset.

Broad Compatibility: Compatible with the VMIVME-9016 intelligent I/O controller, it complies with the VMEbus specification (ANSI/IEEE STD 1014-1987) and is suitable for data transmission in supervisor-level or non-privileged-level short I/O memory spaces.

Highly Reliable Connection: Adopts high-quality 64-pin DIN-type I/O connectors (P3, P4) with shielded cable options, ensuring stable connections in industrial environments.

GE VMIVME-2510B-100 64-Bit TTL IO Megamodule VMIVME2510B...jpg

Technical Specifications

I/O Configuration: 64 TTL I/O channels, divided into 8 independent 8-bit ports, supporting separate configuration of input and output directions for each port.
Data Transmission: Supports 8-bit, 16-bit, and 32-bit data transmission, and is compatible with VMEbus control signals such as address strobe and data strobe.
Address Space: Short supervisor I/O or short non-privileged I/O access modes are selectable via jumper J1, with short supervisor I/O set as the factory default configuration.
Register Configuration: Includes 8 I/O data registers (DR0–DR7) and 1 16-bit Control and Status Register (CSR). The CSR contains port direction control bits, test mode bits, fault indicator control bits, and user-defined storage bits.
Physical Characteristics: Adopts a VMEbus standard board form factor, equipped with P1/P2 board edge connectors and P3/P4 64-pin I/O connectors, suitable for operation in industrial-grade environments.

GE VMIVME-2510B-100 64-Bit TTL IO Megamodule VMIVME2510B.jpg

Working Principle

Overall Architecture: Data transmission and device control are realized through VMEbus basic logic, address decoding circuit, data transceiver, I/O register bank and CSR control logic. The functional block diagram is shown in Figure 1-1.

Address Decoding: Response to specified memory addresses and support for continuous address mapping are achieved via address selection switches (SW1/SW3 control the addresses of data registers, SW2/SW4 control the address of CSR) and comparator circuits.

Data Transmission: The data transceiver (AMD2952 chip) is responsible for data buffering and transmission between the VMEbus and I/O ports. In test mode, the transceiver can be disabled to implement a data loopback test without affecting external devices.

Self-test Mechanism: Setting the test mode bits in the CSR (corresponding to P3/P4 respectively) can initiate offline/online testing. During offline testing, the I/O ports are isolated from external devices; online testing only supports data loopback verification of output ports.


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